SEMINAR: FEI Helios NanoLab: Pushing the limits of extreme high resolution characterisation and sample preparation

Over the past 20 years, focused ion bean (FIB) and SEM/FIB instrumentation has transformed scientists' ability to investigate materials to develop new sample preparation methods to become the industry standard and 'work-horse' for site-specific cross-section analysis, S/TEM sample preparation (cross section of plan view), 3D large volume imaging at the nanometre scale, and nanoscale patterning/prototyping applications. The Helios NanoLab provides researchers with sub-nm imaging performance from 1 - 30 keV to characterise beam sensitive materials and observe true surface information with XHR resolution. With the assistance of the Helios NanoLab's Tomahawk FIB and the EasyLift manipulator, high-quality, ultra-thin S/TEM samples can be prepared at site specific locations in 1-2 hours. Using both the SEM and the FIB, it is possible to prototype nanoscale features by material removal or beam induced deposition for fluidic, MEMS and photonics applications. Additionally, this seminar will discuss important aspects of performing automated volume imaging for both imaging and analytical experiments using Slice and View. This session will explore the Helios NanoLab DualBeam and how it helps researchers contribute to these application spaces.